Results & Downloads

The fourth AddMorePower newsletter is now available for download. In this edition, we highlight the technical progress achieved across our work packages and look back on the many conferences and workshops where our partners have been showcasing our research.

Dislocations create elastic fields, detectable by surface-sensitive techniques like EBSD and ECCI. In this report, a field dislocation mechanics (FDM) model to compare surface and bulk dislocation signatures in GaN layers on Si substrates is used. Significant differences between surface and bulk fields highlight potential misinterpretations in surface-based dislocation characterization. Metrics for accurate dislocation characterization and perform virtual ECCI are established.

Plastic deformation of Cu metallization in power devices results from a combination of heat and thermomechanical stress, mainly produced by the difference in CTE between the metal and the semiconductor and oxides. Using electron microscopy, we found that the deformation mechanisms implying dislocation activities explain a minor portion of the changes endured by the copper. It is therefore supposed that pore formation and cracks growth result from another mechanism, probably grain boundary accelerated diffusion.

A new in-situ set-up for thermal cycling of copper on silicon (polyheater) samples has been established at IKTS. An exemplary sample was imaged using X-ray transmission imaging, validating the set-up functionality. New sample layouts for 3D imaging were designed and produced at Infineon Technologies Austria and KAI, but could not yet be imaged due to production delays.

The AddMorePower project uses the repository/database NOMAD, developed by FAIRmat. It is a material science-oriented database, adhering to the FAIR principles that offers both public and private instances. The document explains the choice for this tool and the development that are needed to properly use this tool in the project.

Operando Strain Microscopy in GaN/Si High Electron Mobility Transistors with Nanosecond Time Resolution 

Authors: C. Corley-Wiciak, N.T. Sammler, B. Butej, A.A. Corley-Wiciak, L. Neumann, M. Sievers,  
P.A. Douissard, S. Leake, C. Detlefs, M. Glavanovics, M. Reisinger, T.U. Schulli.

Operando Strain Microscopy in GaN/Si High Electron Mobility Transistors with Nanosecond Time Resolution 

Authors: C. Corley-Wiciak, N.T. Sammler, B. Butej, M. Stabentheiner, L. Neumann, A.A. Corley-Wiciak, M. Sievers, P. Everaere, P.A. Douissard, S. Leake, E. Capria, T.N. Tran Caliste, C. Detlefs, M. Glavanovics, M. Reisinger, T.U. Schulli

Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination

Authors: C. Detlefs, N. A. Henningsson, B. Kanesalingam, A. A. W. Cret-ton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim and L. E. Dresselhaus-Marais 

In situ TEM investigation of deformation mechanisms in thick copper films 

Authors: Liz Karanja, Marc Legros

The third AddMorePower newsletter is now available for download. In this edition, we review the project status after 2 years and the events that we participated in to promote our project.

In-situ TEM investigation of thermomechanical fatigue of thick Copper copper metallizations  

Authors: L. Karanja, S. Moser, M. Reisinger, M. Legros 

Advanced Synchrotron characterization at KAI/Infineon Pushing the limits in space and time 

Authors: M. Reisinger, T. Ziegelwanger, C. Corley-Wiciak 

Advances in Characterisation Methods and Computational Modelling

Authors: Geoffrey Daniel, Ludovic Jason, Alexandre Ouzia, André Clausner, Catharina Jaeken, Anssi Laukkanen, John-Alan Pascoe, Marco Sebastiani, Giovanni Bolelli, Alexandra Simperler

Materials characterization – Terminology and structured documentation

Authors: Olivia Pfeiler (KAI), André Clausner (IKTS)

Estimation of dislocation densities with non-destructive SEM techniques: application to GaN 

Authors: Arka MANDAL, Benoit BEAUSIR, Julien GUYON, Vincent TAUPIN, Antoine GUITTON

Depth Dependence of Electron Channeling Contrast Imaging (ECCI) in Gallium Nitride

Author: Etienne Lavallee

Nanoscale examination of degradation in copper metallization layers using lab-based nanoTXM and DFXM 

Authors: Laura Neumann, André Clausner, MIchael Reisinger, Cedric Corley-Wiciak, Can Yildrim, Carsten Detlefs 

Revealing the Full Strain Tensor for Semiconductor Technology 

Authors: C. Corley-Wiciak, M. Stabentheiner, M. Reisinger, T. Schulli

Understanding The Damage And Microstructural Evolution In Cu Metallizations During Thermo-mechanical Fatigue

Authors: Michael Reisinger, Laura Neumann, Tobias Ziegelwanger, Sebastian Moser, Kristina Kutukova, Bartlomiej Lechowski, Ehrenfried Zschech

D7.1 provides an initial plan for dissemination and exploitation incl. communication activities and training and will be periodically updated based on the project’s progress. It also constitutes an initial dissemination & communication kit for AddMorePower, as well as the launch of the project website and communication infrastructure in M03.

In this report the imaging protocols for lab-based Transmission X-ray Microscopy and nano-computed tomography technique (TXM/nano-CT) to study use case samples from WP6 at nanoscale is developed and described. The characterisation methodology based on applying several photon energies provided by two TXM/nano-CT tools to study polyheaters with certain geometry and cycling parameters.

D2.2 includes the systematic description and documentation of materials modelling and characterization data created in AddMorePower. To allow interoperability, AddMorePower uses the community standards CHADA and MODA.

The comprehensive Data Management Plan (DMP) outlines the type of collected data, produced research outputs, the compliance with the FAIR data principles, the way in which data will be stored and preserved throughout the lifespan of AddMorePower, ethical aspects and security issues. The DMP will be a living document which will be regularly updated.

The project quality plan (project handbook) constitutes a set of project templates and explains the project management, review, internal quality control process, and other organizational topics such as meeting organization. This handbook shall support all partners in their daily work.

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source 

Kristina Kutukova, Laura Neumann, André Clausner

Short paper in Annual report: Multi energy x-ray photon microscopy of Cu degradation 

Authors: Laura Neumann, André Clausner

The second AddMorePower newsletter is now available for download. In this edition, we present the project status after one year, events that have happened as well as the upcoming ones.

Advanced Analysis and Monitoring of Failure Mechanisms in Thin as well as Thick Microelectronics Metallization Structures

Authors: André Clausner, Matthias Kraatz, Laura Neumann

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics

Authors: Lechowski, Bartlomiej, Kutukova, Kristina, Clausner, Andre 

X-ray microscopy radiation studies of thermo-mechanically degraded Cu metallization layers

Author: Laura Neumann 

The 1^st AddMorePower Newsletter has been released, which is focused on the results of the first 6 months of the project.

The official leaflet of the Horizon Europe project “AddMorePower” is available, containing project information, mission, vision and goals of the project.

We are thrilled to announce the publication of our announcement letter for the AddMorePower project. Click on the link and have a dive into our project aims.