20 May, 2026
On May 13, 2026, André Clausner (Fraunhofer IKTS) participated in the 41st ITG Discussion Meeting “Failure Mechanisms in Small Geometries” in Erfurt, Germany.
Based on results from the AddMorePower project, he presented “Advanced time-resolved experimental assessment of coupled thermo-mechanical-electrical reliability of microelectronics at the examples of stroboscopic DFXM GaN-HEMT micro-strain mapping” within the framework of the ITG Technical Committee 8.5 “Quality and Reliability of Integrated Circuits.”
