Scientific Publications

Operando Strain Microscopy in GaN/Si High Electron Mobility Transistors with Nanosecond Time Resolution 

Authors: C. Corley-Wiciak, N.T. Sammler, B. Butej, A.A. Corley-Wiciak, L. Neumann, M. Sievers,  
P.A. Douissard, S. Leake, C. Detlefs, M. Glavanovics, M. Reisinger, T.U. Schulli.

Obtaining Geometrically Necessary Dislocation Densities from Five Dimensional Scanning X-ray Diffraction Microscopy 

Authors: A. Mandal, C. Corley-Wiciak, T. U. Schulli, A. Guitton ton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim and L. E. Dresselhaus-Marais

Operando Strain Microscopy in GaN/Si High Electron Mobility Transistors with Nanosecond Time Resolution 

Authors: C. Corley-Wiciak, N.T. Sammler, B. Butej, M. Stabentheiner, L. Neumann, A.A. Corley-Wiciak, M. Sievers, P. Everaere, P.A. Douissard, S. Leake, E. Capria, T.N. Tran Caliste, C. Detlefs, M. Glavanovics, M. Reisinger, T.U. Schulli

Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination

Authors: C. Detlefs, N. A. Henningsson, B. Kanesalingam, A. A. W. Cret-ton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim and L. E. Dresselhaus-Marais 

In situ TEM investigation of deformation mechanisms in thick copper films 

Authors: Liz Karanja, Marc Legros

In-situ TEM investigation of thermomechanical fatigue of thick Copper copper metallizations  

Authors: L. Karanja, S. Moser, M. Reisinger, M. Legros 

Advanced Synchrotron characterization at KAI/Infineon Pushing the limits in space and time 

Authors: M. Reisinger, T. Ziegelwanger, C. Corley-Wiciak 

Advances in Characterisation Methods and Computational Modelling

Authors: Geoffrey Daniel, Ludovic Jason, Alexandre Ouzia, André Clausner, Catharina Jaeken, Anssi Laukkanen, John-Alan Pascoe, Marco Sebastiani, Giovanni Bolelli, Alexandra Simperler

Materials characterization – Terminology and structured documentation

Authors: Olivia Pfeiler (KAI), André Clausner (IKTS)

Estimation of dislocation densities with non-destructive SEM techniques: application to GaN 

Authors: Arka MANDAL, Benoit BEAUSIR, Julien GUYON, Vincent TAUPIN, Antoine GUITTON

Depth Dependence of Electron Channeling Contrast Imaging (ECCI) in Gallium Nitride

Author: Etienne Lavallee

Nanoscale examination of degradation in copper metallization layers using lab-based nanoTXM and DFXM 

Authors: Laura Neumann, André Clausner, MIchael Reisinger, Cedric Corley-Wiciak, Can Yildrim, Carsten Detlefs 

Revealing the Full Strain Tensor for Semiconductor Technology 

Authors: C. Corley-Wiciak, M. Stabentheiner, M. Reisinger, T. Schulli

Understanding The Damage And Microstructural Evolution In Cu Metallizations During Thermo-mechanical Fatigue

Authors: Michael Reisinger, Laura Neumann, Tobias Ziegelwanger, Sebastian Moser, Kristina Kutukova, Bartlomiej Lechowski, Ehrenfried Zschech

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source 

Kristina Kutukova, Laura Neumann, André Clausner

Short paper in Annual report: Multi energy x-ray photon microscopy of Cu degradation 

Authors: Laura Neumann, André Clausner

Advanced Analysis and Monitoring of Failure Mechanisms in Thin as well as Thick Microelectronics Metallization Structures

Authors: André Clausner, Matthias Kraatz, Laura Neumann

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics

Authors: Lechowski, Bartlomiej, Kutukova, Kristina, Clausner, Andre 

X-ray microscopy radiation studies of thermo-mechanically degraded Cu metallization layers

Author: Laura Neumann